The Ultimate Solution for X-ray 3D CT Analysis.
SF160ACT is a high-resolution micro-focus X-ray system for the inspection of
semiconductor, PCB assembly, and electronic component. With its superior X-ray imaging, micro-scale hidden
defects can be detected in high resolution.
SF160ACT equips 160kV micro-focus open tube with 1um spot size. The system can magnify the object up to 4,800x and display the X-ray image at any angle using 6-axis manipulator configuration.
X-eye 5100/3100 Series are a high-performance X-ray Inspection system for general non-destructive testing and failure analysis. With 90kV micro-focus closed tube equipped, X-eye 5100/3100 provide high quality X-ray image with 5 micro focal spot size.
With programmable multi-axis control, including table-tilting function X-eye
5100/3100 X-eye can inspect the object at any magnification and any oblique view. With Auto Teaching
(CNC programming), the system can be used as a semi-automatic inspection system. X-eye 5100/3100 Series
come with user-friendly operating environment. Various measuring and annotation tools are included.
High-Performance 3D CT System for laboratory NDT analysis
X-eye Micro CT is compact X-ray 3D CT system for laboratory NDT analysis. With micro-focus X-ray tube, the system provides the internal structure of component such as semiconductor packaging, small electronic parts (MEMS), or molded plastic components.
SNE-4500M is focused on two essentials: powerful performance and user-friendly environment. Even with the table-top configuration, SNE-4500M provides high-quality SEM images with the ease of use. No doubt about strong performance and flexible integration - full stroke control including tilt and rotation, optional EDX system and many other tools for your application. Mini-SEM can easily magnify up to 100,000x with variable (5kV to 30kV) accelerating voltage in seconds. Auto-focus, Auto-brightness and contrast produce an excellent image every time.
The SNE-5000M is a high-performance scanning electron microscope for observing fine structures. SNE-5000M provides Max. 300,000x magnification with switchable Max. 30kV accelerating voltage which fully covers all analytical applications. With outstanding configuration flexibility and unparalled operator-friendly desing, SNE-5000M will provide the best laboratory microscopy solution.
MEDS (Energy Dispersive Spectroscope) can be adapted to all SEC Scanning
Electron Microscopes. Elemental Analysis is the most widely used technique for elemental
identification and visualization of material. EDS analysis facilitates the characterization of nearly
all matter simultaneously starting from beryllium (4) on the periodic table. This technique is
critical to the development of novel materials in research and development and for analyzing failures
in the manufacturing process.